(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

Oleksandr Yefanov, Cornelius Gati, Gleb Bourenkov, Richard A. Kirian, Thomas A. White, John C. H. Spence, Henry N. Chapman, Anton Barty Philosophical Transactions ...

X-ray diffraction (XRD) is an essential technique to identify the structures and compositions of newly developed materials. However, XRD patterns consist of multiple peaks, and it is not always ...

X-ray crystallography is a powerful non-destructive technique for determining the molecular structure of a crystal. X-ray crystallography uses the principles of X-ray diffraction to analyze the sample ...

XRD works by directing X-rays onto a crystalline material and analyzing the angles and intensities of the diffracted beams. The atomic planes within the crystal act as a three-dimensional grating, ...

With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...

“X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been ...

Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...