Abstract: In modern semiconductor manufacturing, optimizing plasma etching processes is key for advancing technology and achieving profitable production. In this study, we propose an efficient process ...
Abstract: Unsupervised machine learning algorithms, such as clustering and anomaly detection, work by identifying patterns and anomalies in data without the need for labeled training data. These ...
Objective Cardiovascular diseases (CVD) remain the leading cause of mortality globally, necessitating early risk identification to improve prevention and management strategies. Traditional risk ...